Non-contact sheet resistance measurement device 'DELCOM'
Achieving high-precision measurements over a wide measurement range without causing physical damage to the sample!
"DELCOM" is a non-contact sheet resistance measurement system using the DC eddy current method. It is used in research and development, inspection processes, and manufacturing lines for semiconductor/LCD substrates, solar cell cells, flexible materials, and various conductive films, achieving high-precision measurements over a wide measurement range without causing physical damage to the samples. The measurement applications include semiconductors, ITO films, graphene & carbon, capacitive metal wheels, and electromagnetic wave absorbing materials. 【Features】 ■ Non-contact sheet resistance measurement system using the DC eddy current method ■ Does not cause physical damage to samples in research and development, inspection processes, and manufacturing lines ■ Achieves high-precision measurements over a wide measurement range ■ The measurement range can be selected from four ranges according to the resistance range *For more details, please refer to the PDF document or feel free to contact us.
- Company：雄山 東京支店
- Price：Other
